In RF/microwave/millimeter-wave testing, there are two main devices that interact with the DUT in addition to coaxial devices and waveguide interconnects. They include surface probes attached to component leads or microstrip pads,wafer test and antennas for testing. The types of tests applied to probes and antennas vary widely, but both are critical to testing the characterization, conformance, and quality of RF devices and components.
RF Test Probes
Test probes typically consist of a waveguide or coaxial connector appropriate for the probe type. Probe types include single pins, grounded signal pins, grounded signal pins, and coaxial pins. These probes are suitable for connecting components located on the surface of semiconductor wafers, chips or printed circuit boards (PCBs) u002F equipment test points or dials. If coaxial or waveguide connectors cannot be placed on a surface or component device due to performance,wafer level testing cost, or space constraints, probes are often used in this case.
One of the most common uses of RF test probes is for wafer-level testing of components and devices at high frequencies. In some cases, some RF test probes are suitable for testing millimeter-wave circuits operating at a maximum frequency of several hundred GHz. there are also several types of RF test probes that can be soldered or mechanically attached to a test surface (usually a PCB surface). failure analysis However, they are only used when such high quality and costly interconnections are absolutely necessary, as they usually cannot be withdrawn without sacrificing the quality of the interconnection.
RF test probes are usually used in conjunction with inspection equipment or electronics with large aperture positioning mechanisms for fine tuning of the probe X, Y, Z and additional axes. Some simple mechanical test probe positioners can only hold the probe in place during testing, while more sophisticated probe positioners with robotic capabilities can be programmed to automatically position the probe and can be suitable for high volume testing.
RF Test Antennas
RF system test pass antennas can be used for over-the-air (OTA) testing. This is usually accomplished through network communication technology standards and electromagnetic compatibility (EMC) standards as well as testing. In these functional test analysis cases, the device under test (DUT) is usually placed in an open air test range (OATR) with low electromagnetic interference or in a full-wave darkroom built for this research purpose. Typically, such antenna designs must be established to meet a precise description of performance issues as defined by national standards. This includes a precise gain, directivity, VSWR, and localization development requirements.
However, OTA testing can be used in other situations as well. Applications include in-house testing using radar and platform-mounted equipment (e.g., ground vehicles and aircraft) to confirm performance and operation during prototyping. Since the type of antenna used for this testing depends on the system to be tested, we offer a variety of antenna types to choose from. Antenna types include conical/horn waveguide, broadband waveguide, omnidirectional waveguide/coaxial, yagi coaxial, and other types of antennas.
By:Juliana